asylum research afm manual

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic. Silicon probe with no reflex coating for force modulation mode. Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.

Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples. Ergo makes it simpler and faster to acquire high-quality AFM images. operate an Asylum Research MFP-3D™ AFM. Press Release: New “Relate” Software for Correlative Imaging with Atomic…, Oxford Instruments Asylum Research Releases a New Application Note: Introducing…, The AFM for Mechanobiology Webinar is an insightful overview of atomic…, The "Nanotribology with the AFM" application note describes the latest…, Plasma Technology, NanoScience, Andor, NanoAnalysis, Asylum Research, By submitting this form I agree that Oxford Instruments will process my data in the manner described in the, Measuring Nanomechanical and Thermal Properties, Measuring Nanoelectrical and Electrochemical Properties, Controlling Temperature and Gas Environment, Subjecting Samples to Other Driving Forces, Relate: software for correlative imaging with AFM, EM, EDS, and EBSD, Solar, Photovoltaics, and Thermoelectrics, Development of Custom AFM Instrumentation, Measurement of Chemical and Molecular Composition, Solar Cell Electrical and Structural Characterisation, Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Fast scanning with results in seconds instead of minutes, Every step of operation is simpler for remarkable productivity, Small footprint in the lab, huge potential to grow in capability, Support that goes above and beyond your expectations, Unmatched mechanical stability—noise floor, Exceptionally low drift—higher resolution and straight lattice lines, Low noise electronics—no artifacts from electronic noise sources, Supports the fastest, smallest probes (3×9 µm spot size—optional), Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM, Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus), Unmatched range of nanoelectrical and electromechanical characterization modes, Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging, Many standard operating modes and even more optional modes, Includes a standard one-year comprehensive warranty, No-charge technical support and basic applications support for life, Affordable support agreements that offer extended warranties and advanced training. Silicon probe with visible tip apex and magnetic coating for low moment MFM applications. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: permalloy.

Read full article > View all news. f = 150 kHz   |   k =9 N/m   |   tip coating: none. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoCr.

f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none. f = 300 kHz   |   k = 26 N/m   |   tip coating: none. Silicon probe with Al reflective coating for tapping/non contact mode. f = 1600 kHz   |   k = 85 N/m   |   tip coating: none. Each technique requires a separate training. More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users.

Silicon probe with visible tip apex and Au reflex coating for high speed imaging. f = 11 kHz   |   k = 0.01 N/m   |   tip coating: none. Accessories for operation in controlled liquid environments, with or without perfusion. Also includes PFM, STM, and EC-AFM techniques.

French SPM Days 2020. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. 6 8.7 Recommendations and Troubleshooting for AC Mode Imaging in Liquid..... .....205

North America South America Canada Australia, Address:6310 Hollister Ave Santa Barbara, California 93117, Working Days/Hours:Mon - Fri / 8:00AM - 5:00PM PST. f = 70 kHz   |   k = 2 N/m   |   tip coating: none. Asylum AFM: User Guide At its core, the Asylum AFM will provide topographic information about a sample’s surface. Fast silicon probe with visible apex tip for fast imaging.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none. Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime. Silicon probe with sharp tip for high resolution imaging in force modulation mode.

Silicon probe with high aspect ratio (>10) tip for deep trench imaging.

The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. f = 1200 kHz   |   k = 18 N/m   |   tip coating: none. View this product on your quote list, Contact modeDART PFMDual ACDual AC Resonance Tracking (DART)Electrostatic Force Microscopy (EFM)Force curvesForce Mapping Mode (force volume)Force modulationFrequency modulationKelvin Probe Force Microscopy (KPFM)Lateral Force Mode (LFM)Loss tangent imagingMagnetic Force Microscopy (MFM)NanolithographyNanomanipulationPhase imagingPiezoresponse Force Microscopy (PFM)Switching spectroscopy PFMTapping mode (AC mode)Tapping mode with digital Q controlVector PFM, AM-FM Viscoelastic Mapping ModeContact Resonance Viscoelastic Mapping ModeConductive AFM (CAFM) with ORCA™ and Eclipse™ ModeCurrent mapping with Fast Force MappingElectrochemical Strain Microscopy (ESM)Fast Force Mapping ModeHigh voltage PFMNanoscale Time Dependent Dielectric Breakdown (nanoTDDB)Scanning Microwave Impedance Microscopy (sMIM)Scanning Tunneling Microscopy (STM), Tools for quantitative characterization of visoelastic properties, including elastic modulus, loss modulus, loss tangent, as well as for measurement of thermal properties, Tools for measuring electrical properties, including current, resistivity and permittivity, and more. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoPt/FePt.

Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi. Soft (cells, hydrogels) (77) Medium (polymers, rubbers) (98) Hard (metals, …

BioLever fast with CNF tips (also known as BL-AC10FS); Carbon Nano Fiber probe for high resolution imaging.

Product was successfully added to your shopping cart. f = 60 kHz   |   k = 0.4 N/m   |   tip coating: none.

Accessories for subjecting your sample to other driving forces like magnetic fields, mechanical strain, high voltage fields, and more.

f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip. Accessories for controlling temperature, the gas environments (gas/vapor composition or humidity), and operating under ultra-low oxygen and/or water levels in a glovebox.

Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements, f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ti/Ir. Asylum Research is a manufacturer of the MFP-3D Infinity™ high performance AFM. Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.

f = 285 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir, f = 300 kHz   |   k = 42 N/m   |   tip coating: Ti/Ir.

Also includes PFM, STM, and EC-AFM techniques, Additional options to make the MFP-3D work for you. The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime.

The Cypher S is fully upgradable later for environmental control options or even video-rate scanning. f = 320 kHz   |   k = 40 N/m   |   tip coating: none. Add to quote list f = 330 kHz   |   k = 42 N/m   |   tip coating: none. Quartz like probe with more stability for soft contact mode. Quartz like probe with three cantilevers for contact mode.

Asylum Research offers a full suite of tools for characterizing electrical properties at the nanoscale on the MFP-3D™ and Cypher™ families of atomic force microscopes.

Silicon probe with visible tip apex and Al reflex coating for high speed imaging. Add to quote list The Asylum Research Cypher S is the base model of the Cypher AFM microscope family.

Read full article > Jun 10, 2020.

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JavaScript seems to be disabled in your browser. Silicon probe with Al reflective coating for soft tapping mode. OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.

The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. Press Release: New “Relate” Software for Correlative Imaging with Atomic Force Microscopy and Electron Microscopy.

It’s like a manual, but more brief and to the point regarding procedures.

BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid. The blueDrive photothermal excitation option is also under this accessory family.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir. Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging. This research AFM has the widest range of options and modes. Silicon probe with PtIr coating for tapping/non-contact mode. Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.

Infinity has the widest range of imaging modes and accessories, with renowned versatility, powerful capabilities, and a system architecture ready for future expansion.

f = 50 kHz   |   k = 0.1 N/m   |   tip coating: none.

Its inception was to alleviate time spent training lab members, and has evolved into a document to help new or sporadic users how to navigate the software, and be more efficient at operating their AFM.

The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip. Routinely achieve higher resolution than other AFM microscopes, Request Pricing 200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging. Also known as OTESPA; silicon probe with visible apex tip for tapping mode.

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